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Calculation of x-ray refraction from near-edge absorption data only

Author(s):
Publication title:
Optical constants of materilas for UV to x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5538
Pub. Year:
2004
Page(from):
23
Page(to):
30
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454768 [0819454761]
Language:
English
Call no.:
P63600/5538
Type:
Conference Proceedings

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