The evolution of hard x-ray tomography from the micrometer to the nanometer length scale
- Author(s):
Rau, C. ( Argonne National Lab (USA), Univ. of Illinois/Urbana-Champaign (USA), Purdue Univ. (USA), and National Insfitute of Standards and Technology (USA) ) Peterson, K.M. ( Univ. of Illinois/Urbana-Champaign (USA) ) Jemian, P.R. ( Univ. of Illinois/Urbana-Champaign (USA) ) Terry, T. ( Purdue Univ. (USA) ) Harris, M.T. ( Purdue Univ. (USA) ) Vogt, S. ( Argonne National Lab. (USA) ) Richter, C.-P. ( Northwestern Univ. (USA) ) Neuhausler, U. ( Univ. Bielefeld (Germany) ) Schneider, G. ( BESSY GmbH (Germany) ) Robinson, I.K. ( Univ. of Illinois/Urbana-Champaign (USA) ) - Publication title:
- Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5535
- Pub. Year:
- 2004
- Page(from):
- 709
- Page(to):
- 714
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454737 [0819454737]
- Language:
- English
- Call no.:
- P63600/5535
- Type:
- Conference Proceedings
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