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X-ray fluorescence microtomography- and polycapillary-based confocal imaging using synchrotron radiation (Invited Paper)

Author(s):
Vincze, L. ( Univ. Antwerpen (Belgium) )
Vekemans, B. ( Univ. Antwerpen (Belgium) )
Szaloki, I. ( Univ. of Debrecen (Hungary) )
Brenker, F.E. ( Univ. zu Koln (Germany) )
Falkenberg, G. ( Deutsches Elektronen-Synchrotron (Germany) )
Rickers, K. ( Deutsches Elektronen-Synchrotron (Germany) and Geo-ForschungZentrum Potsdam (Germany) )
Aerts, K. ( Univ. Antwerpen (Belgium) )
Grieken, R.Van ( Univ. Antwerpen (Belgium) )
Adams, F. ( Univ. Antwerpen (Belgium) )
4 more
Publication title:
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5535
Pub. Year:
2004
Page(from):
220
Page(to):
231
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454737 [0819454737]
Language:
English
Call no.:
P63600/5535
Type:
Conference Proceedings

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