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Active alignment for interferometric techniques onboard the International Space Station

Author(s):
  • Kebbel, V. ( Bremer Institut fur Angewandte Strahltechnik (Germany) )
  • Becker, J. ( European Space Agency/ESTEC (Netherlands) )
  • Juptner, W. ( Bremer Institut fur Angewandte Strahltechnik (Germany) )
Publication title:
Interferometry XII: Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5532
Pub. Year:
2004
Page(from):
218
Page(to):
228
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454706 [0819454702]
Language:
English
Call no.:
P63600/5532
Type:
Conference Proceedings

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