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Two-point diffraction interferometer for absolute distance measurement

Author(s):
  • Kim, S.-W. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Rhee, H.-G. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Joo, J.-Y. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Kim, Y.-J. ( Korea Advanced Institute of Science and Technology (South Korea) )
Publication title:
Interferometry XII: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5531
Pub. Year:
2004
Page(from):
162
Page(to):
169
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454690 [0819454699]
Language:
English
Call no.:
P63600/5531
Type:
Conference Proceedings

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