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Design considerations and validation of the MSTAR absolute metrology system

Author(s):
Publication title:
Interferometry XII: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5531
Pub. Year:
2004
Page(from):
32
Page(to):
43
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454690 [0819454699]
Language:
English
Call no.:
P63600/5531
Type:
Conference Proceedings

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