Blank Cover Image

Employing spectroscopic and pattern recognition techniques to examine food quality both internally and externally as it cooks in an industrial oven

Author(s):
Publication title:
Second European Workshop on Optical Fibre Sensors : EWOFS '04 : 9-11 June 2004, Santander, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5502
Pub. Year:
2004
Page(from):
313
Page(to):
316
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454348 [0819454346]
Language:
English
Call no.:
P63600/5502
Type:
Conference Proceedings

Similar Items:

Sheridan, C., O'Farrell, M., Lewis, E., Lyons, W. B., Flanagan, C., Jackman, N.

SPIE - The International Society of Optical Engineering

B.,Lyons W., H.,Ewald, C.,Flanagan, S.,Lochmann, E.,Lewis

CNR

King, D., Lyons, W.B., Flanagan, C., Lewis, E.

SPIE-The International Society for Optical Engineering

Jurs, P. C., Ham, C. L., Brugger, W. E.

American Chemical Society

C. Sheridan, M. O'Farrell, E. Lewis, C. Flanagan, J. F. Kerry, N. Jackman

SPIE - The International Society of Optical Engineering

Lewin,I., O'Farrell,J., Walker,J.E.,III.

SPIE-The International Society for Optical Engineering

Sheridan, C., O’Farrell, M., Lewis, E., Flanagan, C., Kerry, J. F., Jackman, N.

SPIE - The International Society of Optical Engineering

Dougherty, N.S., Liu, B.L., O'Farrell, J.M.

National Aeronautics and Space Adminstration

M. O'Farrell, C. Sheridan, E. Lewis, W. Z. Zhao, T. Sun, K. T. V. Grattan

SPIE - The International Society of Optical Engineering

Lowans,B.S., Lewis,M.F., Peck,C.V.

SPIE-The International Society for Optical Engineering

Lyons, W.B., Flanagan, C., Lochman, S., Ewald, H., Lewis. E.

SPIE-The International Society for Optical Engineering

Fairhurst M. C., Farrell P. G.

Martinus Nijhoff Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12