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Optical metrology for the segmented optics on the Constellation-X spectroscopy x-ray telescope

Author(s):
Content, D. A. ( NASA Goddard Space Flight Ctr. (USA) )
Colella, D. ( NASA Goddard Space Flight Ctr. (USA) )
Hadjimichael, T. ( Swales Aerospace (USA) )
Lehan, J. P. ( Universities Space Research Association (USA) )
McMann, J. ( NASA Goddard Space Flight Ctr. (USA) )
Reid, P. B. ( Smithsonian Astrophysical Observatory (USA) )
Saha, T. T. ( NASA Goddard Space Flight Ctr. (USA) )
Zhang, W. W. ( NASA Goddard Space Flight Ctr. (USA) )
3 more
Publication title:
UV and gamma-ray space telescope systems : 21-24 June 2004, Glasgow, Scotland, United Kingdom
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5488
Pub. Year:
2004
Page(from):
272
Page(to):
282
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454201 [0819454206]
Language:
English
Call no.:
P63600/5488-1
Type:
Conference Proceedings

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