Statistical properties of low-frequency noise of optoelectronic coupled devices

Statistical properties of low-frequency noise of optoelectronic coupled devices

Author(s):

Konczakowska, A. ( Gdahsk Univ. of Technology (Poland) )
Cichosz, J. ( Gdahsk Univ. of Technology (Poland) )
Stawarz, B. ( Gdahsk Univ. of Technology (Poland) )

Publication title:

Noise and Information in Nanoelectronics, Sensors, and Standards II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5472

Pub. Year:

2004

Page(from):

375

Page(to):

382

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453945 [0819453943]

Language:

English

Call no.:

P63600/5472

Type:

Conference Proceedings

Details

TDL ID:	ZA00014663
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Fluctuations and Noise : Noise and Information in Nanoelectronics, Sensors, and Standards
Conf. info. (Number):	2004 : 2nd
Conf. info. (Venue):	Maspalomas, Gran Canaria, Spain
Conf. info. (Date):	2004.05.26-2004.05.28

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