Nondestructive testing (NDT) and vibration analysis of defects in components and structures using laser diode shearography
- Author(s):
- Steinchen, W. ( Univ. Kassel (Germany) )
- Gan, Y. ( Univ. Kassel (Germany) )
- Kupfer, G. ( Univ. Kassel (Germany) )
- Mackel, P. ( isi-sys (Germany) )
- Publication title:
- Optical Metrology in Production Engineering
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5457
- Pub. Year:
- 2004
- Page(from):
- 738
- Page(to):
- 748
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453792 [081945379X]
- Language:
- English
- Call no.:
- P63600/5457
- Type:
- Conference Proceedings
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