Image processing provides low-frequency jitter correction for synchroscan streak camera temporal resolution enhancement
- Author(s):
- Uhring, W. ( PHASE Lab., CNRS (France) )
- Jung, M. ( Optronis GmbH (Germany) )
- Summ, P. ( Optronis GmbH (Germany) )
- Publication title:
- Optical Metrology in Production Engineering
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5457
- Pub. Year:
- 2004
- Page(from):
- 245
- Page(to):
- 252
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453792 [081945379X]
- Language:
- English
- Call no.:
- P63600/5457
- Type:
- Conference Proceedings
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