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Advanced PRML data detector for high-density recording

Author(s):
Lee, J. ( Samsung Advanced Institute of Technology (South Korea) )
Lee, J. -W. ( Samsung Advanced Institute of Technology (South Korea) )
Ryu, E. -T. ( Samsung Advanced Institute of Technology (South Korea) )
Cho, E. -S. ( Samsung Advanced Institute of Technology (South Korea) )
Konakov, M. ( Samsung Advanced Institute of Technology (South Korea) )
Shim, J. -S. ( Samsung Electronics Co., Ltd. (South Korea) )
Park, H. -S. ( Samsung Electronics Co., Ltd. (South Korea) )
2 more
Publication title:
Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5380
Pub. Year:
2004
Page(from):
243
Page(to):
249
Pages:
7
Pub. info.:
Bellingham: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452931 [0819452939]
Language:
English
Call no.:
P63600/5380
Type:
Conference Proceedings

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