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Overview of the AEMS project

Author(s):
Mouri, M. ( Shimizu Corp. (Japan) )
Ishimori, Y. ( Toshiba Corp. (Japan) )
Kawano, K. ( Toshiba Corp. (Japan) )
Uchida, H. ( Toshiba E&I Control Systems, Inc. (Japan) )
Ishikawa, Y. ( Able Corp. (Japan) )
Tamiya, E. ( Japan Advanced Institute of Science and Technology (Japan) )
Ishizuka, M. ( Toyama Prefectural Univ. (Japan) )
2 more
Publication title:
Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5270
Pub. Year:
2004
Page(from):
78
Page(to):
85
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451590 [0819451592]
Language:
English
Call no.:
P63600/5270
Type:
Conference Proceedings

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