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Characterization of the high-Z 0.9- to 1.0-MA x-pinch source in the 0.15- to 500-keV region: possible applications of the high-current x-pinch as the sub-keV to 10-keV radiation driver and the 50- to 100-keV backlighter

Author(s):
Publication title:
Laser-generated and other laboratory X-ray and EUV sources, optics, and applications : 4-6 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5196
Pub. Year:
2004
Page(from):
45
Page(to):
56
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450692 [0819450693]
Language:
English
Call no.:
P63600/5196
Type:
Conference Proceedings

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