CD-SEM suitability for CD metrology of modern photomasks
- Author(s):
- Ng, W. ( KLA-Tencor Corp. (USA) )
- Anderson, G. ( KLA-Tencor Corp. (USA) )
- Villa, H. A. ( DuPont Photomasks, Inc. (USA) )
- Kalk, F. D. ( Reticle Technology Ctr., LLC (USA) )
- Publication title:
- Photomask and X-Ray Mask Technology VI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3748
- Pub. Year:
- 1999
- Page(from):
- 585
- Page(to):
- 591
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432308 [081943230X]
- Language:
- English
- Call no.:
- P63600/3748
- Type:
- Conference Proceedings
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