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EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report

Author(s):
Publication title:
X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3443
Pub. Year:
1998
Page(from):
86
Page(to):
97
Pages:
12
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819428981 [0819428981]
Language:
English
Call no.:
P63600/3443
Type:
Conference Proceedings

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