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Optical Characterization of Self-Assembled Ge Dots on Silicon

Author(s):
Publication title:
Self-assembly processes in materials : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
707
Pub. Year:
2002
Page(from):
185
Page(to):
190
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996434 [1558996435]
Language:
English
Call no.:
M23500/707
Type:
Conference Proceedings

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