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High Throughput Characterization of Magnetic Semiconductor Thin Films With a Scanning SQUID Microscope

Author(s):
Fan, X.J.
Murakami, M.
Takahasi, R.
Koida, T.
Matsumoto, Y.
Hasegawa, T.
Fukumura, T.
Kawasaki, M.
Ahmet, P.
Chikyow, T.
Koinuma, H.
6 more
Publication title:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
700
Pub. Year:
2002
Page(from):
55
Page(to):
60
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996366 [1558996362]
Language:
English
Call no.:
M23500/700
Type:
Conference Proceedings

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