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Optical Characterization Of Self-Assembled Ge Dots On Silicon

Author(s):
Publication title:
Current issues in heteroepitaxial growth--stress relaxation and self assembly : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
696
Pub. Year:
2002
Page(from):
215
Page(to):
220
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996328 [155899632X]
Language:
English
Call no.:
M23500/696
Type:
Conference Proceedings

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