Blank Cover Image

Adsorption-Induced Failure Modes of Thin-Film Resonators

Author(s):
Publication title:
Thin films : stresses and mechanical properties IX : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
695
Pub. Year:
2002
Page(from):
365
Page(to):
370
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996311 [1558996311]
Language:
English
Call no.:
M23500/695
Type:
Conference Proceedings

Similar Items:

Kazinczi,R., Mollinger,J.R., Bossche,A.

SPIE-The International Society for Optical Engineering

Bossche,A., Cotofana,C.V.B., Kaldenberg,P., Van Dommelen,I., Mollinger,J.R.

SPIE-The International Society for Optical Engineering

2 Conference Proceedings Design of low-cost resonant mode sensors

Kazinczi, R., Turmezei, P., Mollinger, J.R., Bossche, A.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings Fracture - An Unforgiving Failure Mode

J.R. Goodin

ESA Communications

Kazinczi,R., Mollinger,J.R., Bossche,A.

SPIE - The International Society for Optical Engineering

Moody, N.R., Bahr, D.F., Kent, M.S., Emerson, J.A., Reedy, E.D., Jr.

Materials Research Society

Kutchoukov, V. G., Mollinger, J.R., Bossche, A.

SPIE-The International Society for Optical Engineering

H. Sadeghian, J. F. L. Goosen, A. Bossche, F. van Keulen

Society of Photo-optical Instrumentation Engineers

Bossche,A., Cotofana,C.B.V., Mollinger,J.R.

SPIE-The International Society for Optical Engineering

Kobrin,P.H., Seabury,C., Linnen,C., Harker,A.B., Chung,R., McGill,R.A., Matthews,P.J.

SPIE-The International Society for Optical Engineering

Cotofana,C.V.B., Bossche,A., Mollinger,J.R., Kaldenberg,P.

SPIE-The International Society for Optical Engineering

Linnen,C., Kobrin,P.H., Seabury,C., Harker,A.B., McCill,R.A., Houser,E.J., Chung,R., Weber,R., Swager,T.M.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12