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Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

Author(s):
Edwards, N.V.
Lindquist, O.P.A.
Madsen, L.D.
Zollner, S.
Jarrehdahl, K.
Cobet, C.
Peters, S.
Esser, N.
Konkar, A.
Aspnes, D.E.
5 more
Publication title:
GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
693
Pub. Year:
2002
Page(from):
509
Page(to):
514
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996298 [155899629X]
Language:
English
Call no.:
M23500/693
Type:
Conference Proceedings

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