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High Temperature Dielectric Properties of Sol-Gel Derived Thick PZT Thin Films With Different Zr/Ti Atom Ratios

Author(s):
Publication title:
Ferroelectric Thin Films X : symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
688
Pub. Year:
2002
Page(from):
187
Page(to):
192
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996243 [1558996249]
Language:
English
Call no.:
M23500/688
Type:
Conference Proceedings

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