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High Resolution X-ray Characterization of Tl-2212 Superconducting Thin Films

Author(s):
Daniels, M.J.
Bilello, J.C.
Rek, Z.U.
Hyland, D.
Dew-Hughes, D.
Grovenor, C.R.M.
1 more
Publication title:
Application of synchrotron radiation techniques to materials science VI : symposium held April 16-20, 2001, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
678
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, Penn.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996144 [1558996141]
Language:
English
Call no.:
M23500/678
Type:
Conference Proceedings

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