Nanometer Scale Domain Measurement of Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy

Nanometer Scale Domain Measurement of Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy

Author(s):

Publication title:

Ferroelectric thin films IX : symposium held November 26-30, 2000, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

655

Pub. Year:

2001

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558995659 [155899565X]

Language:

English

Call no.:

M23500/655

Type:

Conference Proceedings

Details

TDL ID:	ZA00014540
Series ID:	PA00000011
Conf. info. (Name):	Symposium on ferroelectric thin films
Conf. info. (Number):	9th
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2000.11.26-2000.11.30

Similar Items:

1 Conference Proceedings Measurement of Three Dimensional Polarization Direction in Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy With Rotating Electric Field Odagawa, Hiroyuki, Cho, Yasuo Materials Research Society	7 Conference Proceedings Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials Cho, Yasuo Materials Research Society
2 Conference Proceedings Visualization of Electrons and Holes Localized in the Gate Thin Film of Metal-Oxide Nitride-Oxide Semiconductor Type Flash Memory by Using Scanning Nonlinear … Honda, Koichiro, Cho, Yasuo Materials Research Society	8 Conference Proceedings Higher Order Nonlinear Dielectric Microscopy Cho, Yasuo, Ohara, Koya Materials Research Society
3 Conference Proceedings Development of Scanning Microwave Microscope for High-Throughput Characterization of Combinatorial Dielectric Thin Film Okazaki, Noriaki, Ahmet, Parhat, Chikyow, Toyohiro, Odagawa, Hiroyuki, Cho, Yasuo, Fukumura, Tomoteru, Kawasaki, … Materials Research Society	9 Conference Proceedings Observation of nanometer-scale crystal grain orientation in ferroelectric thin films using polarization near-field scanning optical microscopy (NSOM) Fuse, T., Takahashi, F., Tsukahara, H. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Observation of Dopant Profile of Transistors Using Scanning Nonlinear Dielectric Microscopy Koichiro Honda, Yasuo Cho Materials Research Society	10 Conference Proceedings Temperature Controlled Scanning Nonlinear Dielectric Microscopy Ohara, K., Cho, Y. Materials Research Society
5 Conference Proceedings Basic Study on High-Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Hiranaga, Yoshiomi, Fujimoto, Kenjiro, Wagatsuma, Yasuo, Cho, Yasuo, Onoe, Atsushi, Terabe, Kazuya, Kitamura, Kenji Materials Research Society	11 Conference Proceedings Visualization of Polarization and Two Dimensional Electron Gas Distribution in AlGaN/GaN Heterostructure Using Scanning Nonlinear Dielectric Microscopy K. Hirose, N. Chinone, Y. Cho Trans Tech Publications
6 Conference Proceedings Polarization Reversal Anti-Parallel to the Applied Electric Field Observed Using a Scanning Nonlinear Dielectric Microscopy Morita, Takeshi, Cho, Yasuo Materials Research Society	12 Conference Proceedings Ferroelectric Property of an Epitaxial Lead Zirconate Titanate Thin Film Deposited by a Hydrothermal Method Morita, Takeshi, Wagatsuma, Yasuo, Cho, Yasuo, Morioka, Hitoshi, Funakubo, Hiroshi, Nava, Setter Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12