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Electromigration in Epitaxial Copper Lines

Author(s):
Goindi, H.S.
Shin, C.S.
Frederick, M.
Shusterman, Y.
Kim, H.
Petrov, I.
Ramanath, G.
2 more
Publication title:
Growth, evolution and properties of surfaces, thin films and self-organized structures : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
648
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995581 [1558995587]
Language:
English
Call no.:
M23500/648
Type:
Conference Proceedings

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