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Structural Characterization of InAs/GaAs and InAs/InP Quantum Dots by Transmission Electron Microscopy

Author(s):
McCaffrey, John P.
Robertson, Michael D.
Poole, Phillip
Wasilewski, Zbig R.
Riel, Bruno
Williams, Robin
Fafard, Simon
2 more
Publication title:
Semiconductor quantum dots II : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
642
Pub. Year:
2001
Pages:
10
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995529 [1558995528]
Language:
English
Call no.:
M23500/642
Type:
Conference Proceedings

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