Blank Cover Image

Generalized Ellipsometry Using a Rotating Sample

Author(s):
Publication title:
Anisotropic nanoparticles--synthesis, characterization and applications : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
635
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995451 [1558995455]
Language:
English
Call no.:
M23500/635
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Generalized ellipsometry of complex mediums in layered systems (Key Lecture)

Schubert, M., Kasic, A., Hofmann, T., Gottschalch, V., Off, J., Scholz, F., Schubert, E., Neumann, H., Hodgkinson, I.J., …

SPIE-The International Society for Optical Engineering
7 Conference Proceedings In Situ Observation of UV/Ozone Oxidation of Silicon Using Spectroscopic Ellipsometry

Saitoh, T., Kobayashi, D., Kimura, D., Asai, K.

MRS - Materials Research Society
2 Conference Proceedings A practical guide to digital holography and generalized sampling

D. P. Kelly, B. M. Hennelly, C. McElhinney, T. J. Naughton

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Depth profile characterization of hydrogen implanted silicon using spectroscopic ellipsometry

Gubiotti, T., Jacy, D., Hoobler, R.J.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings A Single-Step Route Towards Large-Scale Deposition of Nanocomposite Thin Films Using Preformed Gold Nanoparticles

Weiliang Wang, Kevin Cassar, Steve Sheard, Peter Dobson, Simon Hurst, Peter Bishop, Ivan Parkin

Materials Research Society
9 Conference Proceedings Generalized gridding reconstruction from nonuniformly sampled data

Sedarat,H., Nishimura,D.C.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Terahertz generalized Mueller-matrix ellipsometry [6120-16]

Hofmann T, Schade U, Helzinger C M, Woollam J A, Esquinazi, P., Schubert, M.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Use of rotating compensator spectroscoic ellipsometry for monitoring the photoresist etching on Si wafer

Choi, Y.-S., Kim, Y.-H., Kim, G.-H., Oh, H.-K., An, I.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Application of generalized ellipsometry to complex optical systems

Schubert,M., Rheinlander,B., Woollam,J.A., Johs,B.D., Herzinger,C.M.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Any-orientation shear-plate tester by two rotating ways

Xu,D.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings Measurement of rutile TiO2 dielectric tensor from 0.148 to 33ｦﾌm using generalized ellipsometry

Tiwald,T.E., Schubert,M.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Introduction to marked-sampling continuous-net and mixed Petri net systems with an example

Xu,T.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12