Influence of Stress on Structural and Dielectric Anomaly of Bi2(Zn1/3Ta2/3)2O7 Thin Films

Influence of Stress on Structural and Dielectric Anomaly of Bi2(Zn1/3Ta2/3)2O7 Thin Films

Author(s):

Publication title:

Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

875

Pub. Year:

2005

Page(from):

369

Page(to):

376

Pages:

8

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558998292 [1558998292]

Language:

English

Call no.:

M23500/875

Type:

Conference Proceedings

Details

TDL ID:	ZA00014514
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meeting
Conf. info. (Number):	2005
Conf. info. (Venue):	San Francisco, California, U.S.A.
Conf. info. (Date):	2005.03.28-2005.04.01

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