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Investigation of Local Stress Fields: Finite Element Modeling and High Resolution X-ray Diffraction

Author(s):
Loubens, A.
Rivero, C.
Boivin, Ph.
Charlet, B.
Fortunier, R.
Thomas, O.
1 more
Publication title:
Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
875
Pub. Year:
2005
Page(from):
229
Page(to):
236
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998292 [1558998292]
Language:
English
Call no.:
M23500/875
Type:
Conference Proceedings

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