Si1-xGex Nanocrystals Observed by EFTEM: Influence of the Dry and Wet Oxidation Process

Si1-xGex Nanocrystals Observed by EFTEM: Influence of the Dry and Wet Oxidation Process

Author(s):

Cuadras, A.

Publication title:

Group-IV semiconductor nanostructures : symposium held November 29-December 2, 2004, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

832

Pub. Year:

2005

Page(from):

111

Page(to):

116

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997806 [1558997806]

Language:

English

Call no.:

M23500/832

Type:

Conference Proceedings

Details

TDL ID:	ZA00014486
Series ID:	PA00000011
Conf. info. (Name):	Symposium on group-IV semiconductor nanostructures
Conf. info. (Number):	4th
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2004.11.29-2004.12.02

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