Modeling the Stress Evolution of Ion Beam Synthesized Nanocrystals
- Author(s):
Yi, D.O. Sharp, I.D. Xu, Q. Liao, C.Y. Ager, J.W. III. Beeman, J.W. Liliental-Weber, Z. Yu, K.M. Zakharov, D. Haller, E.E. Chrzan, D.C. - Publication title:
- Nanoscale materials and modeling -- relations among processing, microstructure and mechanical properties : symposium held April 13-16, 2004, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 821
- Pub. Year:
- 2004
- Page(from):
- 31
- Page(to):
- 36
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997714 [1558997717]
- Language:
- English
- Call no.:
- M23500/821
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Liberation of Ion Implanted Ge Nanocrystals From a Silicon Dioxide Matrix via Hydrofluoric Acid Vapor Etching
Materials Research Society |
9
Conference Proceedings
Compositional Ordering in InxGa1-xN and its Influence on Optical Properties
Materials Research Society |
4
Conference Proceedings
Photo-Oxidation of Ge Nanocrystals: Kinetic Measurements by In Situ Raman Spectroscopy
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
12
Conference Proceedings
Ionized impurity scattering in isotopically engineered,compensated Ge:Ga,As
Trans Tech Publications |