Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys Measured by Atomic Force Microscopy

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys Measured by Atomic Force Microscopy

Author(s):

Publication title:

Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

803

Pub. Year:

2004

Page(from):

179

Page(to):

184

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997417 [1558997415]

Language:

English

Call no.:

M23500/803

Type:

Conference Proceedings

Details

TDL ID:	ZA00014475
Series ID:	PA00000011
Conf. info. (Name):	Symposium on advanced data storage materials and characterization techniques
Conf. info. (Number):	2003
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2003.12.01-2003.12.04

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