Diffuse X-ray Scattering From InGaAs/GaAs Quantum Dots
- Author(s):
Kohler, Rolf Grigoriev, Daniil Hanke, Michael Schmidbauer, Martin Schafer, Peter Besedin, Stanislav Pohl, Udo W. Sellin, Roman L. Bimberg, Dieter Zakharov, Nikolai D. Werner, Peter - Publication title:
- Progress in compound semiconductor materials -- electronic and optoelectronic applications
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 799
- Pub. Year:
- 2004
- Page(from):
- 345
- Page(to):
- 350
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997370 [1558997377]
- Language:
- English
- Call no.:
- M23500/799
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
8
Conference Proceedings
Temperature dependence homogeneous broadening and gain recovery dynamics in InGaAs quantum dots (Invited Paper)
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Evaluation of the strain field inside and around growth islands by means of X-ray diffuse scattering
MRS-Materials Research Society |
9
Conference Proceedings
Reduction of Defect Density in Structures With InAs-GaAs Quantum Dots Grown at Low Temperature for 1.55 μm Range
Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
11
Conference Proceedings
Recent advances in long-wavelength GaAs-based quantum dot lasers (Invited Paper)
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
12
Conference Proceedings
Structure of InAs quantum dots in Si matrix investigated by high resolution electron microscopy
MRS-Materials Research Society |