'Recovery' Effect of Electron Induced Damage in 4H-SiC Schottky Diodes
- Author(s):
Castaldini, A. Cavallini, A. Rigutti, L. Nava, F. Fuochi, P.G. Vanni, P. - Publication title:
- Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 792
- Pub. Year:
- 2004
- Page(from):
- 611
- Page(to):
- 616
- Pages:
- 6
- Pub. info.:
- Warrendale, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997301 [155899730X]
- Language:
- English
- Call no.:
- M23500/792
- Type:
- Conference Proceedings
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