Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes

Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes

Author(s):

Publication title:

Nanoparticles and nanowire buildings blocks--synthesis, processing, characterization and theory : symposium held April 13-16, 2004, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

818

Pub. Year:

2004

Page(from):

247

Page(to):

252

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997684 [1558997687]

Language:

English

Call no.:

M23500/818

Type:

Conference Proceedings

Details

TDL ID:	ZA00014460
Series ID:	PA00000011
Conf. info. (Name):	Symposium on nanoparticles and Nanowire buildings blocks
Conf. info. (Number):	2004
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	2004.04.13-2004.04.16

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