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Omnidirectional Reflectance and Optical Gap Properties of Si/SiO2 Thue-Morse Quasicrystals

Author(s):
Negro, L.Dal
Stolfi, M.
Yi, Y.
Michel, J.
Duan, X.
Kimerling, L.C.
LeBlanc, J.
Haavisto, J.
3 more
Publication title:
New materials for microphotonics : symposium held April 13-15, 2004, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
817
Pub. Year:
2004
Page(from):
75
Page(to):
82
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997677 [1558997679]
Language:
English
Call no.:
M23500/817
Type:
Conference Proceedings

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