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On the Nature of Weak Spots in High-k Layers Submitted to Anneals

Author(s):
Petry, J.
Vandervorst, W.
Richard, O.
Conard, T.
DeWolf, P.
Kaushik, V.
Delabie, A.
Elshocht, S.Van
3 more
Publication title:
Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
811
Pub. Year:
2004
Page(from):
203
Page(to):
210
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997615 [155899761X]
Language:
English
Call no.:
M23500/811
Type:
Conference Proceedings

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