Structural Properties of SiGe Islands: Effect of Capping

Structural Properties of SiGe Islands: Effect of Capping

Author(s):

Stangl, Julian

Publication title:

Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

749

Pub. Year:

2003

Page(from):

403

Page(to):

414

Pages:

12

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996861 [1558996869]

Language:

English

Call no.:

M23500/749

Type:

Conference Proceedings

Details

TDL ID:	ZA00014409
Series ID:	PA00000011
Conf. info. (Name):	Symposium on morphological and compositional evolution of thin films
Conf. info. (Number):	2002
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2002.12.02-2002.12.05

Similar Items:

1 Conference Proceedings X-Ray Scattering Methods for the Study of Epitaxial Self-Assembled Quantum Dots Stangl, J., Schulli, T., Hesse, A., Bauer, G., Holy, V. Springer	7 Conference Proceedings Spin Relaxation in SiGe Islands Hans Malissa, Wolfgang Jantsch, Gang Chen, Herbert Lichtenberger, Thomas Fromherz, Friedrich Schaeffler, Guenther Bauer, … Materials Research Society
2 Conference Proceedings Strain compensated Si/SiGe quantum cascade emitters grown on SiGe pseudosubstrates Diehl, L., Mentese, S., Sigg, H., Muller, E., Grutzmacher, D., Gennser, U., Sagnes, I., Fromherz, T., Stangl, J., Roch, … Kluwer Academic Publishers	8 Conference Proceedings X-Ray Triple Crystal Diffractometry of Structural Defects in SimGe Superlattices Koppensteiner,E., Hamberger,P., Bauer,G., Holy,V., Kibbel,H., Presting,H., Kasper,E. Trans Tech Publications
3 Conference Proceedings Structural Characterization of Reactive Ion Etched Semiconductor Nonostructures Using X-ray Reciprocal Space Mapping Bauer, G., Darhuber, A. A., Holy, V. MRS - Materials Research Society	9 Conference Proceedings CORRELATION BETWEEN MICROSTRUCTURE AND OPTOELECTRONIC PROPERTIES OF a-SiGe:H Weller, H. C., Bauer, G. H. Materials Research Society
4 Conference Proceedings Structural Characterization of Reactive Ion Etched Semiconductor Nanostructures Using X-ray Reciprocal Space Mapping Bauer, G., Darhuber, A. A., Holy, V. MRS - Materials Research Society	10 Conference Proceedings Strong Deviation of the Lattice Parameter in Si1-x-yGexCy Epilayers From Vegard's Rule Stangl, J., Zerlauth, S., Schaffler, F., Bauer, G., Berti, M., Salvador, D. De, Drigo, A. V., Romanato, F. MRS - Materials Research Society
5 Conference Proceedings *Lateral and vertical ordering of PbSe self-assembled quantum dots in PbSe/PbEuTe superlattices Holy, V., Stangl, J., Springholz, G., Pinczolits, M., Bauer, G. MRS-Materials Research Society	11 Conference Proceedings Recent advances in LEEM/PEEM for structural and chemical analysis Bauer E., Franz T., Koziol C., Lilienkamp G., Schmidt T. Kluwer Academic Publishers
6 Conference Proceedings Intersubband-electroluminescence from Si/SiGe quantum cascade structures Dehlinger,G., Diehl,L., Gennser,U., Sigg,H., Faist,J., Grutzmacher,D.A., Ensslin,K., Muller,E. SPIE-The International Society for Optical Engineering	12 Conference Proceedings Redox Properties of Structural Fe in Smectite Clay Minerals Anke Neumann, Michael Sander, Thomas B. Hofstetter American Chemical Society

1

2

3

4

5

6

7

8

9

10

11

12