Microstructural Characterization of Porous Thin Films
- Author(s):
- Publication title:
- Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 749
- Pub. Year:
- 2003
- Page(from):
- 83
- Page(to):
- 88
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996861 [1558996869]
- Language:
- English
- Call no.:
- M23500/749
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Characterization of optical devices based on liquid crystals embedded in porous thin films
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Optical properties of chiral thin films fabricated by glancing angle deposition
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Enhanced Optical Properties of Engineered Porous Thin Films Using Nematic Liquid Crystals
Society of Vacuum Coaters |
11
Conference Proceedings
Co-Deposition of Au-Sn Eutectic Solder Using Pulsed Current Electroplating
Electrochemical Society |
6
Conference Proceedings
Mueller matrix ellipsometry of multilayer porous columnar thin films with applications to square spiral photonic crystals
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Optical properties of porous helical thin films and the effects of post-deposition annealing
SPIE - The International Society of Optical Engineering |