Blank Cover Image

Microstructural Characterization of Porous Thin Films

Author(s):
Publication title:
Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
749
Pub. Year:
2003
Page(from):
83
Page(to):
88
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996861 [1558996869]
Language:
English
Call no.:
M23500/749
Type:
Conference Proceedings

Similar Items:

Sit,J.C., Kennedy,S.R., Broer,D.J., Brett,M.J.

SPIE-The International Society for Optical Engineering

L'Ecuyer, J. D., Loretto, M. H., Farr, J. P. G., Keen, J. M., Castledine, J. G., L'Esperance, G.

Materials Research Society

Vick, D., Smy, T., Dick, B., Kennedy, S., Brett, M.J.

Materials Research Society

Thompson,D.G.

Trans Tech Publications

Robbie,K., Sit,J.C., Broer,D.J., Brett,M.J.

SPIE - The International Society for Optical Engineering

Sit,J.C., Kennedy,S.R., Broer,D.J., Brett,M.J.

SPIE - The International Society for Optical Engineering

van Popta, A.C., Kennedy, S.R., Broer, D.J., Sit, J.C., Brett, M.J.

SPIE - The International Society of Optical Engineering

Sit, J.C., Brett, M.J.

SPIE - The International Society of Optical Engineering

S.R. Kennedy, J.C. Sit, M.J. Brett, D.J. Broer

Society of Vacuum Coaters

Doesburg, J., Ivey, D.G.

Electrochemical Society

Gospodyn, J., Summers, M.A., Brett, M.J., Sit, J.C.

SPIE - The International Society of Optical Engineering

van Popta, A. C., Sit, J. C., Brett, M. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12