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Measurements of the Refractive Indices of MOCVD and HVPE Grown AlGaN Films Using Prism-Coupling Techniques Correlated With Spectroscopic Reflection/Transmission Analysis

Author(s):
Sanford, Norman A.
Robins, Lawrence H.
Davydov, Albert V.
Shapiro, Alexander J.
Tsvetkov, Denis V.
Dmitriev, Vladimir A.
Keller, Stacia
Mishra, Umesh K.
DenBaars, Steven P.
4 more
Publication title:
GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
743
Pub. Year:
2002
Page(from):
695
Page(to):
700
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996809 [155899680X]
Language:
English
Call no.:
M23500/743
Type:
Conference Proceedings

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