Kelly, K.F., Donhauser, Z.J., Lewis, P.A., Smith, R.K., Weiss, P.S.
Kluwer Academic Publishers
|
Moers P. H. M., Tack G. R., Noordman J. F. O., Segerink B. F., van Hulst F. N., Bolger B.
Kluwer Academic Publishers
|
Stranick J. S., Bumm A. L., Kamna M. M., Weiss S. P.
Kluwer Academic Publishers
|
Kim, H. S., Zheng, Y. C., Bryant, P. J.
Materials Research Society
|
Marrian C. R. K., Perkins F. K., Brandow S. L., Koloski T. S., Dobisz E. A., Calvert J. M.
Kluwer Academic Publishers
|
Stovneng J. A., Lipavsky P.
Plenum Press
|
Bozhevolnyi I. S., Zayats V. A., Vohnsen B.
Kluwer Academic Publishers
|
Bainier,C., Courjon,D.A., Salvi,J., Baida,F., Girard,C., Vigoureux,J.-M., Castiaux,A.
SPIE-The International Society for Optical Engineering
|
Kelly,K.F., Sarkar,D., Oldenburg,S.J., Hale,G.D., Halas,N.J.
SPIE-The International Society for Optical Engineering
|
Evoy, S., Harnett, C. K., Keller, S., Mishra, U. K., DenBaars, S. P., Craighead, H. G.
MRS-Materials Research Society
|
Reuter, E. E., Gu, S. Q., Bohn, P. W., Dorsten, J. F., Abeln, G. C., Lyding, J. W., Bishop, S. G.
MRS - Materials Research Society
|
Hibino, K., Oreb, B.F., Fairman, P.S.
SPIE-The International Society for Optical Engineering
|