Blank Cover Image

On the evolution of SOI materials and devices

Author(s):
Colinge, J.P.  
Publication title:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
185
Pub. Year:
2005
Page(from):
11
Page(to):
26
Pages:
16
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402030116 [1402030118]
Language:
English
Call no.:
N17050/185
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Performance of Double-Gate SOI nMOSFETs at Low Temperature

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society
7 Conference Proceedings Effect of Quantum Confinement in SOI Single-Hole Transistors

Tang, X., Baje, X., Colinge, J.P., Van de Wiele, F., Bayot, V.

Electrochemical Society
2 Conference Proceedings Characterization of SOI MOSFETs at microwave frequencies

Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G.

Electrochemical Society
8 Conference Proceedings Nature of high-temperature charge instability of fully depleted SOI MOSFETs

Nazarov, A.N., Lysenko, V.S., Colinge, J.P., Flandre, D.

Electrochemical Society
3 Conference Proceedings Dual gate SOI MOSFET: physics and potential

Colinge, J P

Electrochemical Society
9 Conference Proceedings Evolution of SOI MOSFETs: From Single Gate to Multiple Gates

Colinge, Jean-Pierre

Materials Research Society
4 Conference Proceedings SOI Technology for Deep-Submicron CMOS Applications,

Colinge, J.-P.

Electrochemical Society
10 Conference Proceedings Direct extraction method of SOI MOSFET transistors parameters

Raskin, J P, Gillon, R, Vonhoenacker, D, Colinge, J P

Electrochemical Society
5 Conference Proceedings Gate-All-Around Technology for Harsh Environment Applications

Colinge, J.P.

Kluwer Academic Publishers
11 Conference Proceedings Self-Consistent Simulation of Nano Scale SOT Devices: The Case of Nano Flash Memory

Tang, X., Baje, X., Colinge, J.P., Van de Wide, F., Bayor, V.

Electrochemical Society
6 Conference Proceedings Investigation of salicide processes for thin film SOI microwave applications

Chen, J., Colinge, J.P., Flandre, D., Gillon, R., Raskin, J.P., Vanhoenacker, D.

Electrochemical Society
12 Conference Proceedings Parameter Extraction for Buried Oxide Traps from High-Temperature Kink Effect of Back- Channel SOI TM n-MOSFET

Nazarov, A N, Barchuk, I P, Lysenko, V S L, Colinge, J P

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12