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SiC/SiO2 interface defects

Author(s):
Afanas'ev, V. V.  
Publication title:
Defects in SiO[2] and related dielectrics : science and technology
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
2
Pub. Year:
2000
Page(from):
581
Page(to):
598
Pages:
18
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9780792366850 [0792366859]
Language:
English
Call no.:
N17050/2
Type:
Conference Proceedings

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