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Computational studies of self-trapped excitons in silica

Author(s):
Publication title:
Defects in SiO[2] and related dielectrics : science and technology
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
2
Pub. Year:
2000
Page(from):
329
Page(to):
338
Pages:
10
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9780792366850 [0792366859]
Language:
English
Call no.:
N17050/2
Type:
Conference Proceedings

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