Blank Cover Image

Excitons, localized states in silicon dioxide and related crystals and glasses

Author(s):
Trukhin, A. N.  
Publication title:
Defects in SiO[2] and related dielectrics : science and technology
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
2
Pub. Year:
2000
Page(from):
235
Page(to):
284
Pages:
50
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9780792366850 [0792366859]
Language:
English
Call no.:
N17050/2
Type:
Conference Proceedings

Similar Items:

Trukhin,A.N.

SPIE-The International Society for Optical Engineering

Silbey, R., Munn, R.

American Chemical Society

Springis, M., Trukhin, A.N., Tale, I.

SPIE-The International Society for Optical Engineering

Trukhin,A., Boatner,L.A.

Trans Tech Publications

Trukhin, A.N.

Electrochemical Society

Hapert, J.J. van, Tomozeiu, N., Faassen, E.E. van, Vredenberg, A.M., Habraken, F.H.P.M.

Materials Research Society

Rogulis,U., Trukhin,A., Spaeth,J.-M., Springis,M.

Trans Tech Publications

migliori A., Clogston M. A., Maxton M. P., Hill R. J., Moore S.D., McDowell K. H.

Plenum Press

Trukhin,A.N.

Trans Tech Publications

P.C. Taylor

Society of Photo-optical Instrumentation Engineers

Dubin, V. M., Ozanam, F., Chazalviel, J. -N.

MRS - Materials Research Society

Sachdeva, R., Istratov, A.A., Shan, Wei, Deenapanray, P.N.K., Weber, E.R.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12