Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis

Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis

Author(s):

Publication title:

Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004

Title of ser.:

Materials science forum

Ser. no.:

490-491

Pub. Year:

2005

Page(from):

1

Page(to):

6

Pages:

6

Pub. info.:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499694 [0878499695]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00014245
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Residual Stresses : ICRS
Conf. info. (Number):	7th
Conf. info. (Venue):	Xi'an, China
Conf. info. (Date):	2004.06.14-2004.06.17

Similar Items:

1 Conference Proceedings Stress and Texture Analysis with Two-Dimensional X-Ray Diffraction He, B.B., Preckwinkel, U., Smith, K.L. Trans Tech Publications	7 Conference Proceedings X-ray Residual Stress Measurement in Films with Crystallographic Texture and Grain Shape Yu, L. G., Hendrix, B. C., Xu, K. W., He, J. W., Gu, H. C. MRS - Materials Research Society
2 Conference Proceedings Stress measurement with two-dimensional X-ray diffraction He,B.B. SPIE-The International Society for Optical Engineering	8 Conference Proceedings Wind analysis on the observations of sand wave SAR images in Taiwan Shoal K. Fan, W. Huang, M. He, B. Fu, X. Gan Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings An Investigation of Residual Stress of Porous Titania Layer by Micro-Arc Oxidation under Different Voltages Huang, P., Xu, K. W., He, B. B., Han, Y. Trans Tech Publications	9 Conference Proceedings Two-dimensional multichannel acousto-optic modulator and acousto-optic matrix-vector multiplication Zhao,Q., He,S., Yu,K., Xu,M., Bai,X., Zhao,P. SPIE-The International Society for Optical Engineering
4 Conference Proceedings Sensing targets behind the opaque structures based on the combined method of ray tracing and diffraction [6010-24] Huang X., Chen B., Cui H.-L., Wang K., Pastore R., Farwell M., Chin W., Ross J., Mingle M. SPIE - The International Society of Optical Engineering	10 Conference Proceedings Analysis of SiGe FET Device Structures on Silicon-on-Sapphire Substrates by X-ray Diffraction Mooney, P. M., Chu, J. O., Ott, J. A., Jordan-Sweet, J. L., Dubbelday, W. B., Kavanagh, K. L., Lagnado, I., Meyerson, B. … MRS - Materials Research Society
5 Conference Proceedings The formation of close-packed two-dimensional CdSe colloidal films by electric-field-induced deposition Xu, L., Huang, X. F., Chen, H. M., Chen, W. L., Liu, Z. G., Chen, K. J. MRS-Materials Research Society	11 Conference Proceedings X-ray diffraction analysis of self-organized InAs quantum dots Zhuang,Y., Wang,Y.T., Ma,W.Q., Wang,W., Yang,X.P., Chen,Z.G., Jiang,D.S., Zheng,H.Z. SPIE-The International Society for Optical Engineering
6 Conference Proceedings Three-dimensional simulation of micropumps Xu,Y., Kong,Y.P., Zhang,X.X., Yao,K., Choong,W.O., Tay,F.E.H., Wang,W.P. SPIE-The International Society for Optical Engineering	12 Conference Proceedings Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques Huang, X.R., Dudley, M., Cho, W., Okojie, R.S., Neudeck, P.G. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12