Blank Cover Image

Comparative Analysis of Shot-Peening Residual Stresses Using Hole-Drilling and X-Ray Diffraction Methods

Author(s):
Publication title:
ECRS 5 : proceedings of the Fifth European Conference on Residual Stresses : held September 28-30, 1999 in Delft-Noordwijkerhout, The Netherlands
Title of ser.:
Materials science forum
Ser. no.:
347-349
Pub. Year:
2000
Page(from):
138
Page(to):
143
Pages:
6
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498550 [0878498559]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Nobre, J.P., Loureiro, A., Batista, A.C., Dias, A.M.

Trans Tech Publications

Li, J. B., Gai, X. Y., Wang, D. L., Ma, S. Y., Ji, V.

Trans Tech Publications

Gibmeier, J., Kornmeier, M., Scholtes, B.

Trans Tech Publications

Ould, C., Rouhaud, E., Francois, M., Chaboche, J.L.

Trans Tech Publications

A. Nau, G.G. Feldmann, J.P. Nobre, W. Zinn, B. Scholtes

Trans Tech Publications

Gibmeier, J., Lu, J., Scholtes, B.

Trans Tech Publications

M.J. Marques, A. Castanhola Batista, L. Coelho, J.P. Nobre, A. Loureiro

Trans Tech Publications

Korsunsky, A.M., Kim, K.M., Regino, G.M.

Trans Tech Publications

E.G. Sobolevski, A. Nau, B. Scholtes

Trans Tech Publications

M.J. Marques, A.C. Batista, J. Rebelo-Kornmeier, M. Hofmann, J.P. Nobre

Trans Tech Publications

Rebelo, J.C., Kornmeier, M., Batista, A.C., Dias, A.M.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12