Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films

Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films

Author(s):

Publication title:

Shape memory materials : proceedings of the International Symposium and Exhibition on Shape Memory Materials (SMM '99), held in Kanazawa, Japan, in May 1999

Title of ser.:

Materials science forum

Ser. no.:

327-328

Pub. Year:

2000

Page(from):

175

Page(to):

178

Pages:

4

Pub. info.:

Tuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498512 [0878498516]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00014221
Series ID:	PA00000012
Conf. info. (Name):	International Symposium and Exhibition on Shape Memory Materials : SMM
Conf. info. (Number):	1999
Conf. info. (Venue):	Kanazawa, Japan
Conf. info. (Date):	1999.01.00

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