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Comparative Fluctuation Microscopy Study Of Medium-Range Order In Hydrogenated Amorphous Silicon Deposited By Various Methods

Author(s):
Abelson, J. R.
Crall, R. S.
Gibson, J. M.
Guha, S.
Jin, H. C.
Treacy, M. M. J.
Voyles, P. M.
Yang, J.
3 more
Publication title:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
609
Pub. Year:
2001
Page(from):
A2.4
Pub. info.:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558995178 [155899517X]
Language:
English
Call no.:
M23500/609
Type:
Conference Proceedings

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