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Charge Pumping Characterization of TFTs: The Effect of Hydrogen Annealing

Author(s):
Balasinski, A.
Sundaresan, R.
Hodges, R.
Bryant, F.
Huang, K.W.
Worley, J.
Liou, F.T.
2 more
Publication title:
Proceedings of the Second Symposium on Thin Film Transistor Technologies
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-35
Pub. Year:
1994
Page(from):
219
Page(to):
227
Pages:
9
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770941 [1566770947]
Language:
English
Call no.:
E23400/950720
Type:
Conference Proceedings

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